• DocumentCode
    3476560
  • Title

    120 V super junction LDMOS transistor

  • Author

    Panigrahi, Sunil Kumar ; Baghini, Maryam Shojaei ; Gogineni, Usha ; Iravani, Farshid

  • Author_Institution
    Electr. Eng. Dept., IIT-Bombay, Mumbai, India
  • fYear
    2013
  • fDate
    3-5 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Super junction (SJ) is one of the emerging principles used in high-voltage high-power semiconductor devices. Implementation of SJ principle with charge balance in the pillars has overcome the “Silicon-limit”. SJ principle demands formation of back-to-back reverse biased p-n pillars. Main technology constraint is formation of narrow pillars with high aspect ratio and charge imbalance in these pillars. We propose a method to obtain high breakdown voltage in planar SJ-LDMOS by reducing the effect of charge imbalance at the drain end without reducing width of the pillars and no significant change in ION. The breakdown voltage of 120 V in a HV CMOS technology with tox of 13nm is achieved without ION degradation, as compared to 100 V conventional LDMOS device.
  • Keywords
    CMOS integrated circuits; MOSFET; semiconductor device breakdown; HV CMOS technology; SJ principle; aspect ratio; back-to-back reverse biased p-n pillars; breakdown voltage; charge imbalance; high-voltage high-power semiconductor devices; main technology constraint; silicon-limit; super junction LDMOS transistor; voltage 120 V; Benchmark testing; CMOS integrated circuits; CMOS technology; Calibration; Simulation; TV; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/EDSSC.2013.6628135
  • Filename
    6628135