DocumentCode

347670

Title

Changing our Path to High Level ATPG

Author

Davidson, Scott

Author_Institution

Sun Microsystems Inc.

fYear

1999

fDate

1999

Firstpage

1114

Lastpage

1114

Keywords

Automatic test pattern generation; Search problems; Sun; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805849

Filename

805849