Title :
STIL: the device-oriented database for the test development lifecycle
Author_Institution :
Priority Technol. Inc., USA
Abstract :
STIL is uniquely positioned among the plethora of circuit interaction databases offered by the various EDA and ATE companies because of its device-oriented approach to data representation. This freedom from platform allegiance allows STIL to be used at any, or all, of the stages of the product test development lifecycle
Keywords :
automatic test equipment; automatic test pattern generation; data structures; database management systems; design for testability; electronic engineering computing; product development; semiconductor device testing; ATE; EDA; IEEE P1450.1; STIL; circuit interaction databases; data representation; device-oriented database; product test development; test development lifecycle; test generation flow; Circuit testing; Containers; Costs; Data engineering; Databases; Discrete event simulation; Electronic design automation and methodology; Life testing; Programmable logic arrays; Timing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805880
