Title :
Statistical guarantees of performance for MIMO designs
Author :
Kumar, J. Ayanand Asok ; Vasudevan, Shobha
Author_Institution :
Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fDate :
June 28 2010-July 1 2010
Abstract :
Sources of noise such as quantization, introduce randomness into Register Transfer Level (RTL) designs of Multiple Input Multiple Output (MIMO) systems. Performance of these MIMO RTL designs is typically quantified by metrics averaged over simulations. In this paper, we introduce a formal approach to compute these metrics with high confidence. We define best, bounded and average case performance metrics as properties in a probabilistic temporal logic. We then use probabilistic model checking to verify these properties for MIMO RTL and thereby guarantee the statistical performance. If a property fails, we show a characterization of error. However, probabilistic model checking is known to encounter the problem of state space explosion. With respect to the properties of interest, we show sound and efficient reductions that significantly improve the scalability of our approach. We illustrate our approach on different non-trivial components of MIMO system designs.
Keywords :
MIMO communication; integrated circuit design; logic design; performance evaluation; probabilistic logic; temporal logic; MIMO RTL design; case performance metric; error characterization; multiple input multiple output system; noise source; probabilistic model checking; probabilistic temporal logic; register transfer level; state space explosion; Acoustic noise; Computational modeling; Explosions; MIMO; Measurement; Noise level; Probabilistic logic; Quantization; Registers; State-space methods;
Conference_Titel :
Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7500-1
Electronic_ISBN :
978-1-4244-7499-8
DOI :
10.1109/DSN.2010.5544281