Title :
Measurement-based analysis of fault and error sensitivities of dynamic memory
Author :
Yim, Keun Soo ; Kalbarczyk, Zbigniew ; Iyer, Ravishankar K.
Author_Institution :
Coordinated Sci. Lab., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fDate :
June 28 2010-July 1 2010
Abstract :
This paper presents a measurement-based analysis of the fault and error sensitivities of dynamic memory. We extend a software-implemented fault injector to support data-type-aware fault injection into dynamic memory. The results indicate that dynamic memory exhibits about 18 times higher fault sensitivity than static memory, mainly because of the higher activation rate. Furthermore, we show that errors in a large portion of static and dynamic memory space are recoverable by simple software techniques (e.g., reloading data from a disk). The recoverable data include pages filled with identical values (e.g., `0´) and pages loaded from files unmodified during the computation. Consequently, the selection of targets for protection should be based on knowledge of recoverability rather than on error sensitivity alone.
Keywords :
software fault tolerance; storage management; data-type-aware fault injection; dynamic memory; error sensitivity; fault sensitivity; measurement-based analysis; recoverability knowledge; software-implemented fault injector; static memory; Application software; Computer networks; Coordinate measuring machines; Costs; Error correction codes; Fault location; Hardware; Protection; Random access memory; Target tracking;
Conference_Titel :
Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7500-1
Electronic_ISBN :
978-1-4244-7499-8
DOI :
10.1109/DSN.2010.5544287