Title :
Microwire-wound resistors in high value resistance measurements in VNIIM
Author :
Semenov, Yu ; Samodurov, I.
Author_Institution :
VNIIM, St. Petersburg, Russia
Abstract :
VNIIM provides traceability of high-resistance measurements using single and transfer resistance standards comprising resistors wound with a cast microwire in glass tegument (CMW). Accuracy of 100 kOhm - 10 GOhm measurements is of ppm order and is confirmed by a number of key and bilateral comparisons. Resistance unit transfer from 1 GOhm to 1 (100) TOhm is carried out using T-shaped imitators made of microwire resistors.
Keywords :
electric resistance measurement; resistors; T-shaped imitators; VNIIM; cast microwire; glass tegument; microwire wound resistors; resistance 100 kohm to 10 Gohm; resistance measurements; resistance unit transfer; transfer resistance standards; Electrical resistance measurement; Electromagnetic measurements; Resistors;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544296
