• DocumentCode
    3477205
  • Title

    A Capacitor-less Low Drop-out (LDO) Regulator with Improved Transient Response for System-on-Chip Applications

  • Author

    Lovaraju, C. ; Maity, Avisek ; Patra, Abani

  • fYear
    2013
  • fDate
    5-10 Jan. 2013
  • Firstpage
    130
  • Lastpage
    135
  • Abstract
    This paper presents a capacitor-less low drop-out (LDO) regulator with a slew-rate enhancement circuit. The proposed slew-rate enhancement circuit senses the transient voltage at the output of the LDO to increase the bias current of the error amplifier for a short duration. Hence, the transient response of the regulator is significantly improved due to the enhancement of the slew-rate at the gate of the pass transistor. The proposed LDO regulator has been designed and simulated in UMC 0.18 μm standard CMOS process. Simulation results show that, the LDO regulator consumes a quiescent current of 40 μA only. It regulates the output voltage at 1.2 V from a 1.4 V - 1.8 V supply, with a minimum drop-out voltage of 200 mV at the maximum output current of 100 mA. With the proposed LDO regulator, the amount of overshoot/undershoot in the output voltage under extreme load transients and the settling time of the regulator are 75 mV/ 71 mV and 1.172 μs/ 1.055 μs respectively for a load slew-rate of 99 mA / 1 μs. The proposed LDO regulator has recorded an improvement of 60.9% in terms of the settling time in the post-layout simulation when compared to previously published work.
  • Keywords
    CMOS integrated circuits; amplifiers; system-on-chip; transient response; transistors; LDO regulator; UMC standard CMOS process; capacitor-less low drop-out regulator; current 40 muA; error amplifier; extreme load transients; pass transistor; size 0.18 mum; slew-rate enhancement circuit; system-on-chip; transient response; transient voltage; voltage 1.2 V; voltage 200 mV; Capacitance; Logic gates; Regulators; System-on-chip; Transient analysis; Transient response; Transistors; Capacitor-less low drop-out (LDO) regulator; dynamic biasing; slew-rate enhancement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on
  • Conference_Location
    Pune
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4673-4639-9
  • Type

    conf

  • DOI
    10.1109/VLSID.2013.176
  • Filename
    6472627