Design of an STT-MTJ based true random number generator using digitally controlled probability-locked loop

Author

Oosawa, Satoshi ; Konishi, Takayuki ; Onizawa, Naoya ; Hanyu, Takahiro

Author_Institution

Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan

fYear

2015

fDate

7-10 June 2015

Firstpage

1

Lastpage

4

Abstract

This paper presents a design of a True Random Number Generator (TRNG) using a Spin Transfer Torque Magnetic Tunnel Junction (STT-MTJ) device. Since the probability of the STT-MTJ-based TRNG is locked using a digitally controlled feedback loop, the sensitivity of the feedback gain can be reduced greatly, which eliminates a high-gain amplifier in the feedback loop. It is demonstrated using the circuit simulator (NS-SPICE where the STT-MTJ model is established based on 90nm CMOS/MTJ process technologies) and MATLAB that the random sequences generated from the TRNG become 50%, where the gain of signal converters in the probability-locked loop is the precision of at most 9bit.

Keywords

CMOS integrated circuits; circuit simulation; digital phase locked loops; magnetic tunnelling; random number generation; random sequences; CMOS-MTJ process technology; MATLAB; NS-SPICE circuit simulator; STT-MTJ; TRNG; digitally controlled feedback loop; digitally controlled probability locked loop; feedback gain; random sequences; signal converters; size 90 nm; spin transfer torque magnetic tunnel junction; true random number generator; CMOS integrated circuits; Generators; Junctions; Magnetic tunneling; Resistance; Security; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International

Conference_Location

Grenoble

Type

conf

DOI

10.1109/NEWCAS.2015.7182089

Filename

7182089