• DocumentCode
    3479707
  • Title

    Study on the influencing factors of peeling strength of aluminum nitride DBC substrates

  • Author

    Zhao Dongliang ; Gao Ling ; Liu Zhiping

  • Author_Institution
    Sci. & Technol. on ASIC Lab., Hebei Semicond. Res. Inst., Shijiazhuang, China
  • fYear
    2013
  • fDate
    11-14 Aug. 2013
  • Firstpage
    724
  • Lastpage
    727
  • Abstract
    Aluminum nitride direct bonded copper (DBC) substrates were fabricated by direct bonding of copper and aluminum nitride under high temperature. Combined with the high current carrying capability of copper and the good insulation property of ceramic substrates, aluminum nitride DBC substrates had high thermal conductivity and electrical insulation, high current capacity, excellent mechanical strength and so on. The substrates were widely applied to power electronics field, such as smart grid, motor car and automotive electronics. In this paper, influencing factors of peeling strength in the production process were discussed. The dense oxide layer was formed on the surface of aluminum nitride in the 1150 °C under oxygen atmosphere. Oxidizing oxygen-free copper by high-temperature oxidation method helped to reduce interface cavity and improve the bonding strength of the copper and aluminum nitride. When the calcination conditions of direct bonded copper were 1068 °C and 600ppm of oxygen content, the peeling strength of the substrates could be reach 75N/cm.
  • Keywords
    adhesion; bonding processes; calcination; electronics packaging; oxidation; substrates; aluminum nitride DBC substrates; aluminum nitride direct bonded copper substrates; bonding strength; calcination conditions; ceramic substrates; dense oxide layer; high-temperature oxidation method; interface cavity; oxygen atmosphere; oxygen-free copper; peeling strength; power electronics field; temperature 1068 C; temperature 1150 C; Aluminum nitride; Atmosphere; Ceramics; Copper; Oxidation; Substrates; Surface morphology; Aluminum nitride DBC substrate; oxidation of aluminum nitride; oxidation of copper; peeling strength;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
  • Conference_Location
    Dalian
  • Type

    conf

  • DOI
    10.1109/ICEPT.2013.6756568
  • Filename
    6756568