• DocumentCode
    3479810
  • Title

    Improvement on learning-based super-resolution by adopting residual information and patch reliability

  • Author

    Kim, Changhyun ; Choi, Kyuha ; Ra, Jong Beom

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    1197
  • Lastpage
    1200
  • Abstract
    Learning-based super-resolution algorithms synthesize high-resolution details by using training data. However, since an input image does not belong to a training image set, there is a limitation in recovering its high-frequency details. In our approach, we build and utilize residual training data to complement missing details. We first estimate a pair of mid- and high-frequency images of each training image by using ordinary training data. We then build residual training data by obtaining the residual mid-and high-frequency images that denote the difference between the estimation and original. Thereby, we can synthesize high-resolution details better by using both ordinary and residual training data sets. In addition, in order to use training data more efficiently, we adaptively select low-resolution patches in an input image. Experimental results demonstrate that the proposed method can synthesize higher-resolution images compared to the existing algorithms.
  • Keywords
    image resolution; learning (artificial intelligence); learning based super resolution; patch reliability; residual information adoption; residual training data; training image set; Bayesian methods; Estimation error; Frequency estimation; Geometry; Image analysis; Image resolution; Interpolation; Markov random fields; Network synthesis; Training data; Super-resolution; learning; reliability; residual;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5413697
  • Filename
    5413697