Title :
Tag-to-tag influence pattern on RSSI
Author :
Yu, Lap-Fai ; Meng, Zhao-Wen
Author_Institution :
Dept. of Comput. Sci.&Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
Abstract :
Radio frequency identification (RFID) has been proposed for years for its potential benefits of use in supply chain management. Yet it still suffers from various scenario-specific problems that may greatly degrade its reliability and applicability. For examples, its readability can be affected by the RF- reflecting/absorbing properties of the package contents on which the tags are pasted and by inter-tags interference.
Keywords :
pattern recognition; radiofrequency identification; supply chain management; RFID; RSSI; intertags interference; radio frequency identification; supply chain management; tag-to-tag influence pattern; Computer science; Degradation; Interference; Object detection; Packaging; Radiofrequency identification; Receiving antennas; Reliability engineering; Sun; Supply chain management;
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
DOI :
10.1109/APMC.2008.4958013
