DocumentCode :
3480977
Title :
Simulation of bonding wire deformation in random vibration
Author :
Peifeng Hu ; Yusheng Cao ; Binhao Lian ; Quanbin Yao
Author_Institution :
Package Design Group, Beijing MXTronics Corp., Beijing, China
fYear :
2013
fDate :
11-14 Aug. 2013
Firstpage :
972
Lastpage :
975
Abstract :
Compared with plastic package, the reliability of ceramic package is very high. With the ever-increasing capabilities of integration, circuits using ceramic package have come the requirements on electronic packaging for providing higher density, higher I/O. For ceramic package using wire bonding, there will be more and more bonding wires because of higher density, higher I/O and input/output pins. In order to give a reasonable design of these bonding wires, there will be three even four layers bonding fingers. Thus, the space between two bonding wires nearby is very small and there loops are very high. Also, bonding wires are very long. However, bonding wires with high loop and long distance have very low reliability. It is very important to know how bonding wires will act when the circuits include these bonding wires are undergoing reliability test. And there will be deformation when bonding wire is tested in random vibration. Therefore, giving simulation results of deformation is necessary to investigate the reliability of bonding wires. Finite Element (FE) simulation is an effective approach to investigate the deformation trend of bonding wires in random vibration. And simulation of bonding wires in random vibration will be proposed using FE software in this paper. Instead of building full package model, the longest bonding wire is built to evaluate deformation and power spectral density (PSD) is applied in the modeling. By comparing the simulation results, the deformation of single wire can be used to investigate the full package model. In addition, deformation of bonding wires with different distance, different loops, different elastic modulus and different wire diameters is compared. Simulation shows that wires with short distance, low loop, high elastic modulus and big wire diameter will have smaller deformation in random vibration. High-Speed micro-camera test is used to verify the simulation results. According to the results we can see that the simulation - esults are fit to the test very well. Finally, constructive suggestion is proposed, which will improve the reliability of bonding wire.
Keywords :
ceramic packaging; deformation; finite element analysis; lead bonding; reliability; vibrations; big wire diameter; bonding fingers; bonding wire deformation; ceramic package; electronic packaging; finite element simulation; full package model; high elastic modulus; high speed microcamera test; low loop; power spectral density; random vibration; reliability test; short distance; wire bonding; Bonding; Deformable models; Integrated circuit modeling; Reliability; Simulation; Vibrations; Wires; deformation; random vibration; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location :
Dalian
Type :
conf
DOI :
10.1109/ICEPT.2013.6756622
Filename :
6756622
Link To Document :
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