DocumentCode
348116
Title
Operator error prevention system of semiconductor foundry manufacturing
Author
Huang, Chien-Chung ; Hsu, S.H. ; Lin, Cu-Lung ; Hu, Shiao-Jong ; Shen, Hsiang-Yin ; Chu, Hsiao-Lung ; Chen, Well-Yao
Author_Institution
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
fYear
1999
fDate
1999
Firstpage
285
Lastpage
287
Abstract
The purpose of this paper is to introduce the operator error prevention system. This system divides the prevention process of operator-related errors into several stages: (1) task analyses and human error identification; (2) classification of human errors; (3) deployment of optimal prevention action; (4) control of error preventive solutions, (5) monitoring and evaluation on potential human error risk. A brief example is provided to illustrate how to implement this system. Since this system was implemented from March 1998, the operator error events were reduced from 163 times in 1997 to 19 times in 1998. The loss from wafers scrapped was reduced from $3,000,000 dollars in 1997 to $360,000 dollars in 1998. The results show the effectiveness of the operator error prevention system
Keywords
errors; human factors; integrated circuit economics; integrated circuit yield; human error identification; operator error prevention system; potential human error risk; semiconductor foundry manufacturing; task analyses; wafer scrap; Error analysis; Foundries; Humans; Inspection; Manufacturing industries; Monitoring; Performance analysis; Risk analysis; Robustness; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
0-7803-5403-6
Type
conf
DOI
10.1109/ISSM.1999.808791
Filename
808791
Link To Document