• DocumentCode
    348116
  • Title

    Operator error prevention system of semiconductor foundry manufacturing

  • Author

    Huang, Chien-Chung ; Hsu, S.H. ; Lin, Cu-Lung ; Hu, Shiao-Jong ; Shen, Hsiang-Yin ; Chu, Hsiao-Lung ; Chen, Well-Yao

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    285
  • Lastpage
    287
  • Abstract
    The purpose of this paper is to introduce the operator error prevention system. This system divides the prevention process of operator-related errors into several stages: (1) task analyses and human error identification; (2) classification of human errors; (3) deployment of optimal prevention action; (4) control of error preventive solutions, (5) monitoring and evaluation on potential human error risk. A brief example is provided to illustrate how to implement this system. Since this system was implemented from March 1998, the operator error events were reduced from 163 times in 1997 to 19 times in 1998. The loss from wafers scrapped was reduced from $3,000,000 dollars in 1997 to $360,000 dollars in 1998. The results show the effectiveness of the operator error prevention system
  • Keywords
    errors; human factors; integrated circuit economics; integrated circuit yield; human error identification; operator error prevention system; potential human error risk; semiconductor foundry manufacturing; task analyses; wafer scrap; Error analysis; Foundries; Humans; Inspection; Manufacturing industries; Monitoring; Performance analysis; Risk analysis; Robustness; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-5403-6
  • Type

    conf

  • DOI
    10.1109/ISSM.1999.808791
  • Filename
    808791