• DocumentCode
    3482695
  • Title

    Photoinduced micron scale maskless etching in transparent glasses

  • Author

    Sauvain, E. ; Kyung, J.H. ; Lawandy, N.M.

  • Author_Institution
    Brown Univ., Providence, RI, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    31 Oct-3 Nov 1994
  • Firstpage
    137
  • Abstract
    In this work we present the results of a new micron-scale maskless photoetching process which is applicable to a large variety of silica-based transparent glasses. The technique uses multiphoton absorption at 532 nm from a mode-locked Q-switched Nd:YAG laser to write the patterns directly onto the glass. The glass was exposed, to a solid Gaussian beam focused to about 70 μm at the glass surface, resulting in intensities of few GW/cm2, for periods of several tens of seconds and then etched in a 12% HF solution for fifteen minutes. The glasses were studied using contact atomic force microscopy (AFM) to determine the topography of the selectively etched patterns
  • Keywords
    laser beam effects; 532 nm; HF; HF solution; YAG:Nd; YAl5O12:Nd; contact atomic force microscopy; glass surface; micron-scale maskless photoetching process; mode-locked Q-switched Nd:YAG laser; multiphoton absorption; photoinduced micron scale maskless etching; selectively etched pattern topography measurement; silica-based transparent glasses; solid Gaussian beam focusing; transparent glasses; Absorption; Atomic force microscopy; Etching; Focusing; Glass; Hafnium; Laser beams; Laser mode locking; Solids; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1470-0
  • Type

    conf

  • DOI
    10.1109/LEOS.1994.586361
  • Filename
    586361