DocumentCode :
3483292
Title :
Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection
Author :
Kryszczuk, Krzysztof ; Poh, Norman
Author_Institution :
IBM Zurich Res. Lab., Zurich, Switzerland
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
146
Lastpage :
153
Abstract :
The use of quality measures in biometrics is rapidly becoming the standard strategy for improving performance of biometric systems, especially in the presence of variable environmental conditions of signal capture. It is often necessary to integrate multiple quality measures into the classification process in order to capture the relevant aspects of signal quality. The inclusion of multiple quality features quickly increases the dimensionality of the classification problem, which leads to the risks of overfitting and dimensionality curse. So far, no mature strategy of coping with multiple quality measures has been developed. In this paper we propose to use a scheme, where the dimensionality of the vector of quality measures is reduced using the Locality Preserving Projections. We show that the proposed technique offers higher accuracy and better generalization properties than existing techniques of classification with quality measures, in same- and cross-device biometric matching scenarios.
Keywords :
biometrics (access control); face recognition; image matching; sensor fusion; vectors; biometric classification; biometric matching; locality preserving projection; multiple quality measures; Accuracy; Biometrics; Degradation; Measurement standards; Signal processing; Statistical learning; System performance; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
ISSN :
2160-7508
Print_ISBN :
978-1-4244-7029-7
Type :
conf
DOI :
10.1109/CVPRW.2010.5544619
Filename :
5544619
Link To Document :
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