Title :
Characterization of power electronics system interconnect parasitics using time domain reflectometry
Author :
Zhu, Huibin ; Hefner, Allen R., Jr. ; Lai, Jih-Sheng
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
The significance of interconnect parasitics of power electronics systems is their effects on converters´ EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like. In this paper, a time domain reflectometry (TDR) measurement-based modeling technique is described for characterizing interconnect parasitics in switching power converters. Experiments are conducted on power components of a prototype high-power inverter, including IGBT modules, busbar, and bulk capacitors. It is shown that the interconnect inductance of the IGBT module can be extracted completely using TDR. It is also shown that the busbar equivalent circuit model can be partitioned into transmission line segments or L-C filter sections, and the bulk capacitor contains a significant equivalent series interconnect inductance
Keywords :
capacitors; electromagnetic interference; equivalent circuits; inductance; insulated gate bipolar transistors; invertors; power convertors; switching circuits; time-domain reflectometry; EMI-related performances; IGBT modules; L-C filter sections; bulk capacitor; bulk capacitors; busbar; busbar equivalent circuit model; conducted EMI noise; current spikes; equivalent series interconnect inductance; high-power inverter; interconnect inductance; power electronics; radiated EMI noise; switching power converters; system interconnect parasitics; time domain reflectometry; transmission line segments; voltage spikes; Capacitors; Electromagnetic interference; Inductance; Insulated gate bipolar transistors; Integrated circuit interconnections; Power electronics; Power measurement; Power system interconnection; Reflectometry; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 1998. PESC 98 Record. 29th Annual IEEE
Conference_Location :
Fukuoka
Print_ISBN :
0-7803-4489-8
DOI :
10.1109/PESC.1998.703445