• DocumentCode
    3486823
  • Title

    Precise millimeter-wave dielectric measurements of single crystal ferroelectric materials

  • Author

    Afsar, Mohammed N. ; Korolev, Konstantin A. ; Li, Zijing

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    583
  • Lastpage
    584
  • Abstract
    Transmittance measurements on various single crystal ferroelectric materials over a broad millimeter-wave frequency range have been performed. The frequency dependence of the complex dielectric permittivity has been determined in the millimeter wave region for the first time. The measurements have been employed using a free-space quasi-optical millimeter-wave spectrometer equipped with a set of high power backward wave oscillators (BWOs) as sources of coherent radiation, tunable in the range from 30 - 120 GHz. The uncertainties and possible sources of instrumentation and measurement errors related to the free-space millimeter-wave technique are discussed. This work has demonstrated that precise MMW permittivities can be obtained even on small thin crystals using the BWO quasi-optical approach. The real and imaginary parts of dielectric permittivity have been extracted from the accurate transmittance spectra. The effect of crystallographic orientation on complex permittivity, which is shown to be more than a factor of 1.5 between different orientations, has been carefully examined for Lithium Niobate.
  • Keywords
    backward wave oscillators; ferroelectric materials; lithium compounds; millimetre wave spectra; permittivity; LiNbO3; coherent radiation; dielectric permittivity; free-space quasioptical millimeter-wave spectrometer; high power backward wave oscillators; millimeter-wave dielectric measurement; single crystal ferroelectric materials; thin crystals; Dielectric measurements; Ferroelectric materials; Frequency dependence; Frequency measurement; Millimeter wave measurements; Millimeter wave technology; Performance evaluation; Permittivity measurement; Power measurement; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544817
  • Filename
    5544817