• DocumentCode
    3486985
  • Title

    High current photoconductive semiconductor switches

  • Author

    Loubriel, G.M. ; O´Malley, M.W. ; Zutavern, F.J. ; McKenzie, B.B. ; Conley, W.R. ; Hjalmarson, H.P.

  • Author_Institution
    Sandia Nat. Lab., Albuquerque, NM, USA
  • fYear
    1988
  • fDate
    20-22 Jun 1988
  • Firstpage
    312
  • Lastpage
    317
  • Abstract
    It is shown that Si photoconductive semiconductor switches (PCSSs) can be used to switch high voltages (up to 123 kV), high fields (up to 82 kV/cm) and high currents (2.8 kA). The ability of the samples to withstand this type of high-voltage, high-current switching depends on the way in which the current penetrates the semiconductor. The appropriate use of water or contacts greatly improves the switching capability. It is also shown that the wafers can support large currents (4.0 kA for GaAs and 2.8 kA for Si) and large linear current densities (3.2 kA/cm for GaAs and 1.4 kA/cm for Si). For GaAs, this linear current density corresponds to about 1 MA/cm2, given a penetration depth of about 10-3 cm. It is determined that the lock-on phenomenon can be triggered with light of varying photon energy to reach a lock-on field that is both impurity-concentration and sample-temperature dependent
  • Keywords
    photoconducting devices; pulsed power technology; semiconductor switches; 0 to 123 kV; 2.8 kA; 4 kA; GaAs photoconductive semiconductor switches; Si photoconductive semiconductor switches; impurity-concentration; linear current densities; lock-on phenomenon; sample-temperature dependent; Circuit testing; Flashover; Gallium arsenide; Laboratories; Photoconducting devices; Power semiconductor switches; Pulse circuits; Semiconductor lasers; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator Symposium, 1988. IEEE Conference Record of the 1988 Eighteenth
  • Conference_Location
    Hilton Head, SC
  • Type

    conf

  • DOI
    10.1109/MODSYM.1988.26289
  • Filename
    26289