Title :
Automated extraction of expert knowledge in analog topology selection and sizing
Author :
McConaghy, Trent ; Palmers, Pieter ; Gielen, Georges ; Steyaert, Michiel
Author_Institution :
ESAT-MICAS, K.U. Leuven, Leuven
Abstract :
This paper presents a methodology for analog designers to maintain their insights into the relationship among performance specifications, topology choice, and sizing variables, despite those insights being constantly challenged by changing process nodes and new specs. The methodology is to take a data-mining perspective on a Pareto Optimal Set of sized analog circuit topologies, then doing: extraction of a specs-to-topology decision tree; global nonlinear sensitivity analysis on topology and sizing variables; and determining analytical expressions of performance tradeoffs. These approaches are all complementary as they answer different designer questions. Once the knowledge is extracted, it can be readily distributed to help other designers, without needing further synthesis. Results are shown for operational amplifier design on a database containing thousands of Pareto Optimal designs across five objectives.
Keywords :
Pareto analysis; analogue circuits; circuit optimisation; data mining; electronic engineering computing; expert systems; network topology; operational amplifiers; Pareto optimal set; analog circuit topology; analog topology selection; analog topology sizing; datamining perspective; expert knowledge automated extraction; operational amplifier design; performance specifications; sizing variables; specs-to-topology decision tree; topology choice; Analytical models; CMOS technology; Circuit simulation; Circuit topology; Databases; Decision trees; Design automation; Operational amplifiers; Performance analysis; Space technology;
Conference_Titel :
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2819-9
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2008.4681603