DocumentCode
3487320
Title
Secondary emission impaired by charge accumulation in dielectrics: the dynamical method
Author
Ferreira, G.F.Leal ; de Figueiredo, M.T.
Author_Institution
Inst. de Fisica de Sao Carlos, univ. de Sao Paulo, Sao Carlos, Brazil
fYear
2005
fDate
11-14 Sept. 2005
Firstpage
200
Lastpage
203
Abstract
R.I.C. equations are applied in an attempt to explain secondary emission measurements obtained by continuous electron beam irradiation of a dielectric (Teflon FEP) according to the dynamic method devised by H. von Seggern.
Keywords
dielectric materials; electron beam effects; secondary emission; RIC equations; charge accumulation; continuous electron beam irradiation; dielectrics; dynamical method; secondary emission; Charge measurement; Current measurement; Dielectric measurements; Electrodes; Electron beams; Equations; Polymers; Production; Pulse measurements; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 2005. ISE-12. 2005 12th International Symposium on
Print_ISBN
0-7803-9116-0
Type
conf
DOI
10.1109/ISE.2005.1612355
Filename
1612355
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