Title :
Investigating coverage-reliability relationship and sensitivity of reliability to errors in the operational profile
Author_Institution :
Dept. of Comput. Sci., Purdue Univ., West Lafayette, IN, USA
Abstract :
The focus of the work is an investigation into the correlation between “true” reliability of a software system and the white box testing measures such as block coverage, c-uses and p-uses coverage. We believe that software reliability and testing measures, especially white box testing, are inherently related. Results from experiments are presented to support this belief. We also demonstrate that the estimated reliability is sensitive to the operational profile defined for the software and hence errors in the operational profile may lead to incorrect reliability estimates
Keywords :
errors; program testing; software reliability; block coverage; c-use coverage; coverage-reliability relationship; errors; estimated reliability; operational profile; p-use coverage; reliability sensitivity; software reliability measures; software system; software testing measures; true reliability; white box testing measures; Application software; Computer errors; Life estimation; Software measurement; Software quality; Software reliability; Software systems; Software testing; Surges; System testing;
Conference_Titel :
Software Testing, Reliability and Quality Assurance, 1994. Conference Proceedings., First International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-7803-2608-3
DOI :
10.1109/STRQA.1994.526380