• DocumentCode
    348949
  • Title

    The “current driven model”-experimental verification and the contribution of Idd delta to digital device radiation

  • Author

    Dash, Glen ; Curtis, Jon ; Straus, Isidor

  • Author_Institution
    Ampyx, Acton, MA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    317
  • Abstract
    Several researchers have proposed that a primary source of emissions from digital devices is due to the partial inductance of the return trace on printed circuit boards. In this “current driven model,” RF currents derived from the nanosecond rise time of periodic signals such as clocks create a voltage across the return due to this inductance. This paper reports on an experimental verification of this model, but points out apparent limitations-at frequencies above a certain point, internal characteristics of integrated circuits such as Idd delta appear to dominate the emissions, at least in the circuits examined
  • Keywords
    MOS digital integrated circuits; printed circuits; radiofrequency interference; Idd delta; RF currents; clocks; current driven model; digital device radiation; integrated circuits; internal characteristics; nanosecond rise time; partial inductance; periodic signals; printed circuit boards; return trace; voltage; Capacitors; Clocks; Inductance; Integrated circuit modeling; Oscillators; Predictive models; Printed circuits; Testing; Voltage; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-5057-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.1999.812920
  • Filename
    812920