DocumentCode
348949
Title
The “current driven model”-experimental verification and the contribution of Idd delta to digital device radiation
Author
Dash, Glen ; Curtis, Jon ; Straus, Isidor
Author_Institution
Ampyx, Acton, MA, USA
Volume
1
fYear
1999
fDate
1999
Firstpage
317
Abstract
Several researchers have proposed that a primary source of emissions from digital devices is due to the partial inductance of the return trace on printed circuit boards. In this “current driven model,” RF currents derived from the nanosecond rise time of periodic signals such as clocks create a voltage across the return due to this inductance. This paper reports on an experimental verification of this model, but points out apparent limitations-at frequencies above a certain point, internal characteristics of integrated circuits such as Idd delta appear to dominate the emissions, at least in the circuits examined
Keywords
MOS digital integrated circuits; printed circuits; radiofrequency interference; Idd delta; RF currents; clocks; current driven model; digital device radiation; integrated circuits; internal characteristics; nanosecond rise time; partial inductance; periodic signals; printed circuit boards; return trace; voltage; Capacitors; Clocks; Inductance; Integrated circuit modeling; Oscillators; Predictive models; Printed circuits; Testing; Voltage; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-5057-X
Type
conf
DOI
10.1109/ISEMC.1999.812920
Filename
812920
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