The influence of straight-fin heatsink on noise susceptibility of IC-capacitive coupling

Author

Nonaka, Junpei ; Nitta, Shuichi ; Mutoh, Atsuo ; Miyashita, Takuya

Author_Institution

Fac. of Eng., Tokyo Univ. of Agric. & Technol., Japan

Volume

1

fYear

1999

fDate

1999

Firstpage

345

Abstract

This study describes the simulated and experimental results about the influence of straight-fin heatsink on the noise susceptibility of an IC. It is concluded that the simulated results obtained by the FEM and the authors´ proposed approximation method used to reduce the computation time are in good agreement with the experimental results to within 2 dB, and the noise susceptibility of the IC increases (immunity degrades) by equipping the IC with a heatsink, but the susceptibility decreases in a narrow range near the resonant frequency of the circuits

Keywords

capacitance; electric noise measurement; electric potential; electromagnetic coupling; electromagnetic induction; electromagnetic interference; finite element analysis; heat sinks; integrated circuit noise; resonance; EMI; FEM; IC noise susceptibility; approximation method; capacitive coupling; computation time reduction; experimental results; induced noise voltage; resonant frequency; simulated results; straight-fin heatsink; Conductors; Electromagnetic heating; Electromagnetic interference; Heat engines; Integrated circuit noise; Noise reduction; Noise shaping; Resistance heating; Space heating; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1999 IEEE International Symposium on

Conference_Location

Seattle, WA

Print_ISBN

0-7803-5057-X

Type

conf

DOI

10.1109/ISEMC.1999.812925

Filename

812925