DocumentCode :
3489964
Title :
The Prospects of the using Wavelet - Transform for Analysis Information Function in the Test Technology
Author :
Kozhanova, E.R. ; Zaharov, A.A. ; Frolov, A.M.
Author_Institution :
Saratov State Tech. Univ.
fYear :
2006
fDate :
20-21 Sept. 2006
Firstpage :
506
Lastpage :
511
Abstract :
In the article is briefly stated bases wavelet - transform and the change from Furie - transform, and are considered prospects of the using wavelet transform and wavelet-analysis in test technology.
Keywords :
information theory; wavelet transforms; Furie-transform; analysis information function; test technology; wavelet-analysis; wavelet-transform; Helium; Indium tin oxide; Information analysis; Tellurium; Testing; Wavelet analysis; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Actual Problems of Electron Devices Engineering, International Conference on
Conference_Location :
Saratov
Print_ISBN :
1-4244-0246-8
Electronic_ISBN :
1-4244-0247-6
Type :
conf
DOI :
10.1109/APEDE.2006.307463
Filename :
4099677
Link To Document :
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