Title :
Influence of heat sink mounting procedure on package reliability
Author :
Yuan, Zhongfa ; Liu, Yong ; Luk, Timwah ; Irving, Scott
Author_Institution :
Fairchild Semicond. (Suzhou) Corp., Suzhou
Abstract :
In this paper, a general finite element analysis (FEA) software ANSYSreg is employed to investigate the influence of heat sink mount process on the package reliability. Different leadframe design and leadframe material options for a power packages are provided for modeling optimization. In simulation, the dynamic procedure of heat sink mounting process is simplified as a qusi static problem. A half package model is built due to its symmetrical structure. In addition, the advanced simulation techniques including both contact analysis and pretension method are introduced to simulate the mounting process. Maximum torque within recommended torque range is applied on different package designs for optimization of the mounting process. Meanwhile possible problems with die cracking and EMC can be predicted. In order to verify the results, actual heat sink mounting process is performed with both previous package design and the optimized package design. Comparison between both designs prove that the optimized package designed by simulation is more robust and reliable.
Keywords :
die casting; finite element analysis; heat sinks; packaging; ANSYS; contact analysis; die cracking; finite element analysis; half package model; heat sink mounting; leadframe design; leadframe material options; optimization; optimized package design; package designs; package reliability; power packages; pretension method; qusi static problem; Design optimization; Electronic packaging thermal management; Electronics packaging; Fasteners; Heat sinks; Lead; Material properties; Packaging machines; Thermal resistance; Torque;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location :
Freiburg im Breisgau
Print_ISBN :
978-1-4244-2127-5
Electronic_ISBN :
978-1-4244-2128-2
DOI :
10.1109/ESIME.2008.4525067