Title :
Monitors for a signal integrity measurement system
Author :
Petrescu, Violeta ; Pelgrom, Marcel ; Veendrick, Harry ; Pavithran, Praveen ; Wieling, Jean
Author_Institution :
Philips Res. Labs., Eindhoven
Abstract :
On-chip monitors are an essential part of a signal integrity measurement system. Temperature, voltage and technology monitors need to comply with various boundary conditions, such as lay-out style, available power supply and limited data communication. This paper reports 90 nm and 65 nm monitors
Keywords :
integrated circuit measurement; integrated circuit testing; real-time systems; 65 nm; 90 nm; monitors; signal integrity measurement system; CMOS technology; Data communication; Power supplies; Process control; Registers; Semiconductor device measurement; Semiconductor device noise; Temperature; Testing; Wiring;
Conference_Titel :
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European
Conference_Location :
Montreux
Print_ISBN :
1-4244-0303-0
DOI :
10.1109/ESSCIR.2006.307546
