DocumentCode :
3490705
Title :
A 3-TFT hybrid active-passive pixel with correlated double sampling CMOS readout circuit for real-time medical x-ray imaging
Author :
Safavian, N. ; Karim, K.S. ; Nathan, A. ; Rowlands, J.A.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON
fYear :
2008
fDate :
15-19 Sept. 2008
Firstpage :
122
Lastpage :
125
Abstract :
This paper presents a new hybrid current-programmed, current-output active pixel sensor (APS) suitable for real time X-ray imaging (fluoroscopy) and an off-panel CMOS readout circuit. The pixel circuit is designed using hydrogenated amorphous silicon (a-Si:H) thin film transistor (TFT) technology. Measurements show that the proposed pixel circuit can successfully compensate for characteristic variations (e.g. mobility and threshold voltage shift) in a-Si:H TFTs under prolonged gate voltage stress. The readout circuit exploits correlated double sampling (CDS) technique to reduce the offset current, low frequency noise and fixed-pattern noise (FPN) on the array operation. Measurements show less than 5% change in the output current of the APS for 3 V shift in the threshold voltage.
Keywords :
CMOS integrated circuits; X-ray imaging; display instrumentation; hydrogen; readout electronics; silicon; thin film circuits; thin film sensors; thin film transistors; Si:H; TFT hybrid active-passive pixel; correlated double sampling CMOS readout circuit; correlated double sampling technique; current-output active pixel sensor; current-programmed active pixel sensor; fixed-pattern noise; fluoroscopy; hydrogenated amorphous silicon thin film transistor; low frequency noise; off-panel CMOS readout circuit; offset current reduction; real time medical X-ray imaging; Biomedical imaging; CMOS image sensors; Circuits; Low-frequency noise; Pixel; Sampling methods; Sensor phenomena and characterization; Thin film transistors; Threshold voltage; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
Conference_Location :
Edinburgh
ISSN :
1930-8833
Print_ISBN :
978-1-4244-2361-3
Electronic_ISBN :
1930-8833
Type :
conf
DOI :
10.1109/ESSCIRC.2008.4681807
Filename :
4681807
Link To Document :
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