• DocumentCode
    3490705
  • Title

    A 3-TFT hybrid active-passive pixel with correlated double sampling CMOS readout circuit for real-time medical x-ray imaging

  • Author

    Safavian, N. ; Karim, K.S. ; Nathan, A. ; Rowlands, J.A.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    122
  • Lastpage
    125
  • Abstract
    This paper presents a new hybrid current-programmed, current-output active pixel sensor (APS) suitable for real time X-ray imaging (fluoroscopy) and an off-panel CMOS readout circuit. The pixel circuit is designed using hydrogenated amorphous silicon (a-Si:H) thin film transistor (TFT) technology. Measurements show that the proposed pixel circuit can successfully compensate for characteristic variations (e.g. mobility and threshold voltage shift) in a-Si:H TFTs under prolonged gate voltage stress. The readout circuit exploits correlated double sampling (CDS) technique to reduce the offset current, low frequency noise and fixed-pattern noise (FPN) on the array operation. Measurements show less than 5% change in the output current of the APS for 3 V shift in the threshold voltage.
  • Keywords
    CMOS integrated circuits; X-ray imaging; display instrumentation; hydrogen; readout electronics; silicon; thin film circuits; thin film sensors; thin film transistors; Si:H; TFT hybrid active-passive pixel; correlated double sampling CMOS readout circuit; correlated double sampling technique; current-output active pixel sensor; current-programmed active pixel sensor; fixed-pattern noise; fluoroscopy; hydrogenated amorphous silicon thin film transistor; low frequency noise; off-panel CMOS readout circuit; offset current reduction; real time medical X-ray imaging; Biomedical imaging; CMOS image sensors; Circuits; Low-frequency noise; Pixel; Sampling methods; Sensor phenomena and characterization; Thin film transistors; Threshold voltage; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
  • Conference_Location
    Edinburgh
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-2361-3
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2008.4681807
  • Filename
    4681807