Fault identification in analog-discrete circuits using general-purpose analysis programs

Author

Farchy, S. ; Gadjeva, E. ; Kouyoumdjiev, T.

Author_Institution

Dept. of Theor. Electr. Eng., Sofia Univ. of Technol., Bulgaria

Volume

1

fYear

1998

fDate

1998

Firstpage

495

Abstract

An approach to fault identification in analog-discrete (SC and SI) circuits is proposed using test measurement data in discrete-time points. The determination of the changed parameter values of the faulty elements is accomplished by a single direct current analysis of a suitable nonlinear identification resistance model. Models of the basic structural elements, as well as the way of the whole identification model construction, are defined. An example considering the SC-circuit fault identification using the PSpice simulator is presented

Keywords

SPICE; circuit simulation; fault diagnosis; network parameters; parameter estimation; switched capacitor networks; switched current circuits; PSpice simulator; SC circuits; SI circuits; analog-discrete circuits; direct current analysis; discrete-time points; fault identification; general-purpose analysis programs; identification model construction; nonlinear identification resistance model; parameter values; structural elements; Capacitors; Circuit analysis; Circuit faults; Circuit testing; Electrical resistance measurement; Electronic equipment testing; Fault diagnosis; Signal analysis; Signal processing; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 1998 IEEE International Conference on

Conference_Location

Lisboa

Print_ISBN

0-7803-5008-1

Type

conf

DOI

10.1109/ICECS.1998.813370

Filename

813370