DocumentCode
349268
Title
InGaAs/GaAs photorefractive quantum well device with quantum confined Stark effect
Author
Kageshima, H. ; Iwamoto, Satoshi ; Nishioka, M. ; Someya, T. ; Miyazaki, H. ; Fukutani, K. ; Arakawa, Y. ; Yasui, I. ; Shimura, T. ; Kuroda, K.
Author_Institution
Dept. of Ind. Sci., Tokyo Univ., Japan
Volume
1
fYear
1999
fDate
1999
Firstpage
68
Abstract
We demonstrated an InGaAs-GaAs photorefractive MQW device with quantum confined Stark effect (QCSE) for the first time. The maximum diffraction efficiency is 2x10-4. This value is 100 times smaller than the expected one. This disagreement indicates the effect of the lateral transport
Keywords
carrier mobility; gallium arsenide; indium compounds; photorefractive materials; quantum confined Stark effect; semiconductor quantum wells; InGaAs-GaAs; InGaAs-GaAs photorefractive MQW device; InGaAs/GaAs photorefractive quantum well device; lateral transport effects; maximum diffraction efficiency; quantum confined Stark effect; Absorption; Dielectrics; Diffraction; Gallium arsenide; Indium gallium arsenide; Photorefractive effect; Photorefractive materials; Potential well; Quantum well devices; Stark effect;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-5634-9
Type
conf
DOI
10.1109/LEOS.1999.813480
Filename
813480
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