DocumentCode :
3492810
Title :
An Improved KNN Algorithm of Intelligent Built-in Test
Author :
Dongchao, Ji ; Bifeng, Song ; Fei, Han
Author_Institution :
Northwestern Polytech. Univ., Xian
fYear :
2008
fDate :
6-8 April 2008
Firstpage :
442
Lastpage :
445
Abstract :
Aimed at the faults of K-nearest neighbor (KNN) algorithm in complex equipment´s built-in test (BIT), an improved KNN (IKNN) algorithm is proposed to solve the problem from two aspects. Firstly, the weight of each input feature is learned using neural network to make important features contribute more in the classifications; this improves the precision of classification. Secondly, clustering each sample of the training set to reduce the data volume of training set, this improves the running speed of the algorithm. Simulation experiments prove the effectiveness of the IKNN algorithm with higher precision and less calculation.
Keywords :
built-in self test; learning (artificial intelligence); neural nets; pattern classification; K-nearest neighbor algorithm; classification precision; intelligent built-in test; neural network; training set; weight learning; Automatic testing; Built-in self-test; Clustering algorithms; Embedded software; Hardware; Multidimensional systems; Neural networks; Software algorithms; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Networking, Sensing and Control, 2008. ICNSC 2008. IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1685-1
Electronic_ISBN :
978-1-4244-1686-8
Type :
conf
DOI :
10.1109/ICNSC.2008.4525257
Filename :
4525257
Link To Document :
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