Title :
Precise and Flexible Modeling for Semiconductor Wafer Fabrication
Author :
Nakamura, Shinji ; Hashimoto, Chisato ; Mori, Osamu
Author_Institution :
NTT LSI Laboratories, Japan
Keywords :
Fabrication; Job shop scheduling; Laboratories; Performance analysis; Performance evaluation; Phase change materials; Semiconductor device manufacture; Semiconductor device modeling; Substrates; Virtual manufacturing;
Conference_Titel :
Simulation Conference Proceedings, 1993. Winter
Print_ISBN :
0-7803-1381-X
DOI :
10.1109/WSC.1993.718323