Title :
A Brain-Computer Interface for classifying EEG correlates of chronic mental stress
Author :
Khosrowabadi, Reza ; Quek, Chai ; Ang, Kai Keng ; Tung, Sau Wai ; Heijnen, Michel
Author_Institution :
Div. of Comput. Sci., Nanyang Technol. Univ., Singapore, Singapore
fDate :
July 31 2011-Aug. 5 2011
Abstract :
In this paper, a Brain-Computer Interface (BCI) for classifying EEG correlates of chronic mental stress is proposed. Data from 8 EEG channels are collected from 26 healthy right-handed students during university examination period and after the examination whereby the former is considered to be relatively more stressful to students than the latter. The mental stress level are measured using the Perceived Stress Scale 14 (PSS-14) and categorized into stressed and stress-free groups. The proposed BCI is then used to classify the subjects´ mental stress level on EEG features extracted using the Higuchi´s fractal dimension of EEG, Gaussian mixtures of EEG spectrogram, and Magnitude Square Coherence Estimation (MSCE) between the EEG channels. Classification on the EEG features are then performed using the K-Nearest Neighbor (K-NN) and Support Vector Machine (SVM). The performance of the proposed BCI is then evaluated from the inter-subject classification accuracy using leave-one-out validation. The results showed that the proposed BCI using features extracted by MSCE yielded a promising inter-subject validation accuracy of over 90% in classifying the EEG correlates of chronic mental stress.
Keywords :
Gaussian processes; brain-computer interfaces; electroencephalography; feature extraction; health care; learning (artificial intelligence); level measurement; medical signal processing; signal classification; support vector machines; BCI; EEG channels; EEG correlate classification; EEG feature extraction; EEG spectrogram; Gaussian mixtures; Higuchi fractal dimension; K-NN; MSCE; SVM; brain-computer interface; chronic mental stress; k-nearest neighbor; magnitude square coherence estimation; mental stress level measurement; perceived stress scale 14; support vector machine; university examination period; Accuracy; Educational institutions; Electroencephalography; Feature extraction; Sensitivity; Stress; Support vector machines;
Conference_Titel :
Neural Networks (IJCNN), The 2011 International Joint Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9635-8
DOI :
10.1109/IJCNN.2011.6033297