Title :
The generalized analysis of parameters measurement of processes in QMS
Author :
Palchun, Yu.A. ; Serikh, V.I. ; Yakimova, I.V. ; Kvitkova, I.G.
Author_Institution :
SNIIM, Novosibirsk, Russia
Abstract :
On the basis of the generalized model of measurement the main equations of measurement of processes in QMS are received.
Keywords :
measurement; quality management; QMS; process parameter measurement; quality management system; The measurement; measurement equations; processes in QMS;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
DOI :
10.1109/APEIE.2012.6629150
