Investigation of signal quality and radiated emission of microstrip line on imperfect ground plane: FDTD analysis and measurement

Author

Lin, Yen-Hui ; Wu, Tzong-Lin

Author_Institution

Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan

Volume

1

fYear

2001

fDate

2001

Firstpage

319

Abstract

Taking four kinds of imperfect ground planes as examples, the effect of the imperfect ground plane on the signal integrity (SI) and electromagnetic interference (EMI) for high-speed digital transmission line on the printed circuit boards (PCB) are investigated both by FDTD simulation and experimental measurement. It is found that good signal quality does not guarantee good EMI performance and ill signal integrity does not imply severe radiated emission. The dominant factor that affects the EMI performance of the signal trace on the reference plane is the path of return current. All simulated S-parameter and EMI behavior of the signal traces are compared with the measurement results. The agreement between them is good

Keywords

S-parameters; electromagnetic interference; finite difference time-domain analysis; microstrip lines; printed circuits; transmission line theory; EMI; EMI performance; FDTD simulation; PCB; bypass capacitor influence; electromagnetic interference; high-speed digital transmission line; ill signal integrity; imperfect ground planes; microstrip line; printed circuit boards; radiated emission; return current path; signal integrity; signal quality; signal trace; signal traces; simulated EMI behavior; simulated S-parameter behavior; Circuit simulation; Distributed parameter circuits; Electromagnetic interference; Electromagnetic measurements; Finite difference methods; Microstrip; Printed circuits; Scattering parameters; Time domain analysis; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on

Conference_Location

Montreal, Que.

Print_ISBN

0-7803-6569-0

Type

conf

DOI

10.1109/ISEMC.2001.950649

Filename

950649