DocumentCode :
3496489
Title :
High resolution EKG with USB connectivity
Author :
Salto-Mendoza, J. ; Reyna-Carranza, M.A. ; López-Avitia, R.
Author_Institution :
Eng. Sch., Autonomous Univ. of Baja California, Mexicali, Mexico
fYear :
2011
fDate :
March 28 2011-April 1 2011
Firstpage :
23
Lastpage :
27
Abstract :
Every hour 8 to 10 Mexicans die because of cardiovascular diseases. The most common pathology is Myocardial Infarction, primarily responsible for deaths throughout of the country, and the leading cause of death in the Baja California state. Those who survive a myocardial infarction are highly likely to suffer Sudden Cardiac Death (SCD) due to the development of malignant ventricular tachycardia. This can be predicted with the detection of so-called Ventricular Late Potentials (VLP) located at the end of the QRS complex and/or at the beginning of the ST segment. The Health Sector in Baja California does not have diagnostic assessment devices that can predict these abnormalities. This document details the progress achieved in the development of a technological package (digital and analog interface for USB communication) capable of capturing, recording and analyzing High-Resolution Electrocardiogram (HRECG). The aim is to predict risk of SCD detecting VLP in infarcted patients in our region using the Classical Time Domain Method and the high resolution electrocardiograph device developed in our lab.
Keywords :
bioelectric potentials; diseases; electrocardiography; Baja California state; Classical Time Domain Method; EKG; High-Resolution Electrocardiogram; Mexican; Myocardial Infarction; QRS complex; Sudden Cardiac Death; USB connectivity; Ventricular Late Potential; cardiovascular disease; malignant ventricular tachycardia; pathology; Band pass filters; Correlation; Electric potential; Electrocardiography; Noise; Noise level; Noise measurement; HRECG; Sudden Cardiac Death; Time Domain method; USB Communication; Ventricular Late Potentials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Health Care Exchanges (PAHCE), 2011 Pan American
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-61284-915-7
Type :
conf
DOI :
10.1109/PAHCE.2011.5871837
Filename :
5871837
Link To Document :
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