DocumentCode
349679
Title
Reduction of the number of tests by coupling together the sequential and the Bayesian method
Author
Guerin, Fabrice ; Dumon, Bernard
Author_Institution
ISTIA, Angers, France
Volume
1
fYear
1999
fDate
1999
Firstpage
954
Abstract
We recommend a method which enables us to reduce the number of tests undertaken according to the sequential method. To achieve this, we take into account the opinion of experts who take a view on the likely value of the sought parameter and its dispersion. Thus, by using the Bayes theorem (with 2 parameters), we can merge these data with the ones obtained during tests on the new product, and reduce therefore the number of tests
Keywords
Bayes methods; gamma distribution; normal distribution; parameter estimation; reliability theory; Bayesian method; new product tests; sequential method; Bayesian methods; Costs; Gaussian distribution; Parameter estimation; Performance evaluation; Sequential analysis; Stress; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location
Tokyo
ISSN
1062-922X
Print_ISBN
0-7803-5731-0
Type
conf
DOI
10.1109/ICSMC.1999.814221
Filename
814221
Link To Document