Title :
Optical design considerations and constraints for implementation of Silicon photomultiplier as a light sensor
Author :
Osovizky, A. ; Pushkarsky, Vitaly ; Ginzburg, Dimitry ; Marcus, Eli ; Kopeika, Nathan ; Manor, Avi ; Ifergan, Yair ; Gonen, Ehud ; Ghelman, Max ; Mazor, Tzachi ; Cohen-Zada, Ilan ; Kadmon, Yagil ; Cohen, Yossef
Author_Institution :
Radiat., Detection, Dept., Rotem Ind. Ltd., Beer-Sheva, Israel
Abstract :
Silicon photomultiplier (SiPM) is a novel photosensor technology. This paper presents the design optimization process for implementing this technology in a scintillator based radiation detectors. The device provides the advantages of low current consumption, small dimensions, and high gain. These properties make the SiPM of great interest for applications involving portable instrumentation. However, a novel approach to establish a set of parameters and their limits is required to optimize performance of this new technology in radiation detection applications. The trade-offs and the influence of factors, such as Photon Detection Efficiency (PDE), dynamic range (DR), various scintillation crystal characteristics, and light reflecting materials, are discussed. This study investigated the incorporation of CsI(Tl) scintillation crystals with SiPM, based on measurements and results for different photo-coupling configurations and the obtained achievements are described. A method for evaluating the photon collection efficiency for Scintillator-SiPM based detectors is proposed.
Keywords :
elemental semiconductors; optical sensors; optimisation; photomultipliers; scintillation; silicon; solid scintillation detectors; current consumption; light reflecting materials; light sensor; optical design considerations; optimization process; photocoupling configurations; photon collection efficiency; photon detection efficiency; portable instrumentation; scintillation crystal characteristics; scintillator based radiation detectors; scintillator-SiPM based detectors; silicon photomultiplier; Crystals; Dynamic range; Noise level; Optical sensors; Photonics; Pixel; Silicon;
Conference_Titel :
Electrical and Electronics Engineers in Israel (IEEEI), 2010 IEEE 26th Convention of
Conference_Location :
Eliat
Print_ISBN :
978-1-4244-8681-6
DOI :
10.1109/EEEI.2010.5662169