• DocumentCode
    3498677
  • Title

    CODA: A concurrent online delay measurement architecture for critical paths

  • Author

    Zhang, Yubin ; Yu, Haile ; Xu, Qiang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
  • fYear
    2012
  • fDate
    Jan. 30 2012-Feb. 2 2012
  • Firstpage
    169
  • Lastpage
    174
  • Abstract
    With technology scaling, integrated circuits behave more unpredictably due to process variation, environmental changes and aging effects. Various variation-aware and adaptive design methodologies have been proposed to tackle this problem. Clearly, more effective solutions can be obtained if we are able to collect real-time information such as the actual propagation delay of critical paths when the circuit is running in normal function mode. Motivated by the above, in this paper, we propose a novel concurrent online delay measurement architecture for critical paths, namely CODA, to facilitate this task. Experimental results demonstrate high accuracy and practicality of the proposed technique.
  • Keywords
    integrated circuit design; integrated circuit testing; time-digital conversion; adaptive design methodology; aging effect; concurrent online delay measurement architecture; integrated circuit; variation-aware methodology; Clocks; Delay; Measurement uncertainty; Probes; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific
  • Conference_Location
    Sydney, NSW
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-0770-3
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2012.6164939
  • Filename
    6164939