Title :
New measurement method for two-port noise parameters
Author :
Pasquet, D. ; Andrei, C. ; Lesenechal, D. ; Descamps, P.
Author_Institution :
LaMIPS, Caen, France
Abstract :
The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input.
Keywords :
low noise amplifiers; noise measurement; semiconductor device noise; impedance; low noise amplifier; noise figure measurement method; two-port noise parameter; Nickel;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location :
Kharkiv
Print_ISBN :
978-1-4244-7900-9
DOI :
10.1109/MSMW.2010.5545989
