Title :
Detection of small defects by THz-waves for non-destructive testing in dielectric layered structures
Author :
Scherbatko, I.S. ; Kuleshov, Ye M.
Author_Institution :
Dept. of Quasi-Opt., Inst. of Radiophys. & Electron., Kharkov, Ukraine
Abstract :
In this study, the small defects detection in dielectric layered structures by THz waves for nondestructive testing. Finite element method were used for modelling of the structures.
Keywords :
dielectric materials; finite element analysis; nondestructive testing; terahertz waves; THz-waves; defect detection; dielectric layered structures; finite element method; nondestructive testing; Noise;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter and Submillimeter Waves (MSMW), 2010 International Kharkov Symposium on
Conference_Location :
Kharkiv
Print_ISBN :
978-1-4244-7900-9
DOI :
10.1109/MSMW.2010.5546032
