Title :
VMOS, UMOS structures simulation in micro and nano scale
Author :
Kersys, T. ; Andriukaitis, D. ; Anilionis, R.
Author_Institution :
Dept. of Electron. Eng., Kaunas Univ. of Technol.
Abstract :
VMOS, UMOS ("V"-groove-metal-oxide-silicon) transistors drain and gate are formed in the groove of "V" or "U" form. Expanding channel area, therefore VMOS and UMOS structures may be used in the power chips. Using VMOS, UMOS saves 40% free space than by using NMOS technology. Nanostructures dimensions are very small, so it is important to keep pn junction in a right depth, and in the all semiconductor manufacturing technological process. Analyzing influence to forming structure of each technological operation, mathematical simulation program SUPREM IV is used. VMOS and UMOS technological operation was simulated in micro and nano level
Keywords :
MOSFET; semiconductor device manufacture; NMOS technology; UMOS; V-groove-metal-oxide-silicon transistors; VMOS; semiconductor manufacturing technological process; Boron; Doping; Etching; Ion implantation; Manufacturing processes; Oxidation; Semiconductor impurities; Silicon; Space technology; Temperature;
Conference_Titel :
Baltic Electronics Conference, 2006 International
Conference_Location :
Tallinn
Print_ISBN :
1-4244-0414-2
Electronic_ISBN :
1736-3705
DOI :
10.1109/BEC.2006.311055