• DocumentCode
    3500000
  • Title

    Diversity in Double-Scattering MIMO Channels

  • Author

    Barua, Bappi ; Shin, Hyundong ; Win, Moe Z.

  • Author_Institution
    Sch. of Electron. & Inf., Kyung Hee Univ., Yongin
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    495
  • Lastpage
    499
  • Abstract
    In this paper, we assess the combined effects of rank deficiency and spatial fading correlation on the diversity performance of multiple-input multiple-output (MIMO) systems in terms of the symbol error probability, the effective fading figure (EFF), and the capacity at low signal-to-noise ratio (SNR). In particular, we consider a general family of MIMO channels known as double-scattering channels - i.e., Rayleigh product MIMO channels - which encompasses a variety of propagation environments from independent and identically distributed Rayleigh to degenerate keyhole cases by embracing both rank-deficient and spatial correlation effects. We quantify the combined effect of the spatial correlation and the lack of scattering richness on the EFF and the low-SNR capacity in terms of the correlation figures of transmit, receive, and scatterer correlation matrices. We further show the monotonicity properties of these performance measures with respect to the strength of spatial correlation, characterized by the eigenvalue majorization relations of the correlation matrices.
  • Keywords
    MIMO communication; Rayleigh channels; correlation methods; electromagnetic wave propagation; error statistics; Rayleigh product MIMO channel; correlation matrix; double-scattering MIMO channel; effective fading figure; multiple-input multiple-output system; propagation environment; rank deficiency; signal-to-noise ratio; spatial fading correlation; symbol error probability; Capacity planning; Channel capacity; Eigenvalues and eigenfunctions; Error probability; Fading; Laboratories; MIMO; Rayleigh channels; Rayleigh scattering; Receiving antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-1644-8
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2008.114
  • Filename
    4525670