• DocumentCode
    3500563
  • Title

    A new rapid screening method for silicones by size exclusion chromatography

  • Author

    Muller, A.J. ; Opila, R.L.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1988
  • fDate
    26-29 Sept. 1988
  • Firstpage
    289
  • Lastpage
    300
  • Abstract
    A method is described of characterizing silicone extracts which provide the entire viscosity distribution of the extract instead of only a single average value. This distinction is very important, since it is the very low viscosity components of the silicone extract that are most likely to creep, thus causing relay contact failures and these components are not detected by methods that provide average viscosity values. In addition, since the lowest viscosity fractions are also the most volatile, this method also addresses the problem of gas-phase transport. The method described requires only standard chromatographic equipment and results can be obtained in a matter of minutes. The development of this method, including the principles underlying the determination of the viscosity distribution, is briefly described, followed by examples of its application and comparisons to other silicone-extract characterization methods.<>
  • Keywords
    chromatography; electrical contacts; encapsulation; materials testing; organic insulating materials; relays; reliability; silicones; application; characterizing silicone extracts; examples; gas-phase transport; low viscosity components; lowest viscosity fractions; relay contact failures; relay contact reliability; screening method; silicone-extract characterization methods; size exclusion chromatography; standard chromatographic equipment; viscosity distribution; Creep; Electronic equipment; Mechanical factors; Oils; Relays; Sealing materials; Semiconductor films; Surface tension; Switches; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/HOLM.1988.16131
  • Filename
    16131