Title :
Plume expansion of pulsed laser ablated zinc oxide
Author :
Gray, T.K. ; Narayan, J. ; Bourham, M.A.
Author_Institution :
Dept. of Mater. Sci. & Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
Summary form only given. High quality zinc oxide thin films have been deposited in the past using pulsed laser ablation. It has been shown that a laser energy density of 3-4 J/cm/sup 2/ produces epitaxial films with reasonably high resistance and good optical properties. However, the reason the pulsed laser ablation process is optimized at these laser energy densities was not known. Single electric probes and optical emission spectroscopy are used to obtain plasma parameters to better understand the deposition of ZnO films. For laser energy densities less than 4.5 J/cm/sup 2/, the electron and ion densities are found to increase monotonically with laser energy density. However, above this critical laser energy density, the plasma density decreases, while electron temperatures remaining constant between 2-5 eV. Above the critical laser energy density, material is no longer evaporated and ionized off of the surface of the target but blown off in a phase explosion. This leads to the decrease in measured plasma density since most of the materials ejected from the target surface are particulates rather than vapor and plasma above this laser energy density.
Keywords :
II-VI semiconductors; laser ablation; plasma density; plasma deposition; plasma probes; plasma temperature; semiconductor epitaxial layers; zinc compounds; 2 to 5 eV; ZnO; electric probes; electric resistance; electron density; electron temperatures; epitaxial films; ion density; laser energy density; optical emission spectroscopy; optical properties; phase explosion; plasma density; plasma parameters; plume expansion; pulsed laser ablated zinc oxide thin films; Electrons; Laser ablation; Optical films; Optical materials; Optical pulses; Plasma density; Pulsed laser deposition; Stimulated emission; Surface emitting lasers; Zinc oxide;
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-8334-6
DOI :
10.1109/PLASMA.2004.1339679