DocumentCode :
3501295
Title :
Language-based high level transaction extraction on on-chip buses
Author :
Huang, Yi-Le ; Wang, Chun-Yao ; Yeh, Richard ; Chang, Shih-Chieh ; Chen, Yung-Chih
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing-Hua Univ., Hsinchu
fYear :
2006
fDate :
27-29 March 2006
Lastpage :
236
Abstract :
With the increasing in silicon densities, SoC designs are the stream in modern electronics systems. Accordingly, the verification for SoC designs is crucial. One of the main problems in SoC verification is to verify whether the interface of a block works properly in its intended system. Transaction-based verification methodologies have been proposed to deal with this problem, and they allow users creating tests and writing test benches more easily. Furthermore, verifying interface designs in transaction level is very efficient. Previous work creates extractor manually for one on-chip bus (OCB), and the extra efforts are needed for other OCBs. In this paper, we present a language-based methodology to specify the bus behaviors in transaction level. Then the actual signals on the buses can be extracted to a higher level of abstraction. The bus behaviors displayed in transaction level significantly reduce the verification efforts for verification engineers. Furthermore, the corresponding transaction extractors are automatically generated. We demonstrate the success of our approach on AMBA AHB and Sonics´ OCP buses
Keywords :
high level synthesis; integrated circuit design; system-on-chip; SoC verification; bus behaviors; high level transaction extraction; interface designs; modern electronics systems; on-chip buses; system-on-chip designs; transaction-based verification; Circuit simulation; Computer displays; Computer science; Design methodology; Intellectual property; Natural languages; Protocols; Silicon; Testing; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2523-7
Type :
conf
DOI :
10.1109/ISQED.2006.79
Filename :
1613141
Link To Document :
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