DocumentCode
3501504
Title
The Class-Specific Down-Looking Target Localization Combining Recognition and Segmentation
Author
Meng, An ; Zhiguo, Jiang ; Danpei, Zhao ; Zhengyi, Liu
Author_Institution
Image Process. Center, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Volume
2
fYear
2010
fDate
11-12 Nov. 2010
Firstpage
522
Lastpage
528
Abstract
In the complex down-looking background, it is difficult to accurately localize various targets because of target deformation and background clutter. In this paper, we develop a target detection algorithm that incorporates bottom-up target segmentation and top-down target recognition. There are two main steps in the algorithm: hypotheses generation (top-down) and hypotheses verification (bottom-up). In the generation step, the study makes an improvement on shape feature, which is more robustness to target deformation. The improved shape feature is used to generate the hypotheses of target locations and figure-ground masks. In the hypotheses verification step, the study firstly computes feasible target segmentation that is consistent with top-down target hypotheses. And then a false positive pruning procedure is proposed. The study also finds the fact that the pruned false positive regions do not align with target segmentation for many down-looking targets. The experimental tasks demonstrate that the algorithm can be high precision and recall with a few positive target-training images and that the algorithm, and be generalized to many target classes.
Keywords
feature extraction; image recognition; image segmentation; object detection; background clutter; bottom up target segmentation; class specific down looking target localization; figure ground mask; hypotheses generation; hypotheses verification; positive target training image; shape feature; target deformation; target detection; target segmentation; top down target recognition; false positive pruning; hypotheses generation; hypotheses verification; shape context feature; target localization;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronics and Image Processing (ICOIP), 2010 International Conference on
Conference_Location
Haiko
Print_ISBN
978-1-4244-8683-0
Type
conf
DOI
10.1109/ICOIP.2010.208
Filename
5662413
Link To Document