DocumentCode
3501908
Title
Evaluation of collapsing methods for fault diagnosis
Author
Adapa, Rajsekhar ; Tragoudas, Spyros ; Michael, Maria K.
Author_Institution
Dept. of ECE, Southern Illinois Univ., Carbondale, IL
fYear
2006
fDate
27-29 March 2006
Lastpage
444
Abstract
This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS´85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method
Keywords
fault diagnosis; logic testing; fault diagnosis; stuck-at fault collapsing methods; Analytical models; Benchmark testing; Cause effect analysis; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2523-7
Type
conf
DOI
10.1109/ISQED.2006.62
Filename
1613176
Link To Document