• DocumentCode
    3501960
  • Title

    Delay fault diagnosis for nonrobust test

  • Author

    Mehta, Vishal J. ; Wang, Zhiyuan ; Marek-Sadowska, Malgorzata ; Tsai, Kun-Han ; Rajski, Janusz

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
  • fYear
    2006
  • fDate
    27-29 March 2006
  • Lastpage
    472
  • Abstract
    With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore nonrobust propagation conditions while emulating the failure analyzer´s behavior. We propose a novel approach to perform delay-fault diagnosis for robust and nonrobust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience
  • Keywords
    delays; fault diagnosis; integrated circuit reliability; integrated circuit testing; delay fault diagnosis; design timing failures; failure analyzer; manufacturing defects; nonrobust propagation conditions; nonrobust test; parameter variations; Algorithm design and analysis; Error correction; Failure analysis; Fault diagnosis; Manufacturing; Performance evaluation; Propagation delay; Robustness; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2523-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2006.45
  • Filename
    1613180