• DocumentCode
    35025
  • Title

    Sign-Perturbed Sums: A New System Identification Approach for Constructing Exact Non-Asymptotic Confidence Regions in Linear Regression Models

  • Author

    Csaji, B.C. ; Campi, M.C. ; Weyer, E.

  • Author_Institution
    Inst. for Comput. Sci. & Control, Budapest, Hungary
  • Volume
    63
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan.1, 2015
  • Firstpage
    169
  • Lastpage
    181
  • Abstract
    We propose a new system identification method, called Sign-Perturbed Sums (SPS), for constructing non-asymptotic confidence regions under mild statistical assumptions. SPS is introduced for linear regression models, including but not limited to FIR systems, and we show that the SPS confidence regions have exact confidence probabilities, i.e., they contain the true parameter with a user-chosen exact probability for any finite data set. Moreover, we also prove that the SPS regions are star convex with the Least-Squares (LS) estimate as a star center. The main assumptions of SPS are that the noise terms are independent and symmetrically distributed about zero, but they can be nonstationary, and their distributions need not be known. The paper also proposes a computationally efficient ellipsoidal outer approximation algorithm for SPS. Finally, SPS is demonstrated through a number of simulation experiments.
  • Keywords
    approximation theory; least squares approximations; regression analysis; SPS; ellipsoidal outer approximation algorithm; least squares estimation; linear regression models; new system identification approach; noise terms; non asymptotic confidence regions; sign perturbed sums; statistical assumptions; Equations; Finite impulse response filters; Least squares approximations; Linear regression; Noise; Probability; Yttrium; Finite sample properties; least squares methods; linear regression models; parameter estimation; statistics; system identification;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2014.2369000
  • Filename
    6951470