DocumentCode :
3502946
Title :
SuperiorDrop test performance of BGA assembly using SAC105Ti solder spheres - virtual fracture analysis
Author :
Weiping Liu ; Ning-Cheng Lee ; Bagheri, Saeed ; Snugovesky, Polina ; Bragg, Jason ; Brush, Russell ; Harper, B.
Author_Institution :
Indium Corp., Clinton, NY, USA
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
405
Lastpage :
409
Abstract :
Assembled BGA/CSP devices with SnAgCu (SAC) solder joints are vulnerable when dropped due to the fragility of solder joints. Although reducing the Ag content of SAC alloy does help, the crack resistance when dropped is still considerably poorer than the eutectic SnPb system. Therefore a new alloy with improved drop test performance is greatly desired. In this work, SAC105 doped with Ti (SAC105Ti) as a BGA/CSP sphere was studied for its drop test reliability. Four different solder combinations were evaluated: 1) SnPb solder paste with SnPb balls, 2) SnPb solder paste with SAC105Ti balls, 3) SAC305 solder paste with SAC105Ti balls, and 4) SAC305 solder paste with SAC105 balls. The number of completely fractured interconnects was counted for each type of component after a total of 100 drops. The cell with the fewest number of fractured joints was the pure SnPb cell, followed closely by SAC305 solder paste/SAC105Ti ball, then SAC305 solder paste/ SAC105 ball and lastly SnPb solder paste/SAC105Ti ball. This trend is consistent with the trend observed by measuring the electrical resistance. The combination of SAC305 solder paste with SAC105Ti balls was the best solder joint structure tested in terms of the lowest number of partial interconnect fractures and outperformed the other three combinations.
Keywords :
assembling; ball grid arrays; copper alloys; electric resistance measurement; fracture; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; lead alloys; semiconductor doping; silver alloys; solders; surface cracks; tin alloys; BGA assembly; BGA/CSP device; SAC alloy; SAC solder joint; SAC105Ti balls; SAC105Ti solder sphere; SAC305 solder paste; SnAgCu; SnPb; crack resistance; doping; drop test reliability; electrical resistance measurement; eutectic system; fractured interconnects; fractured joints; solder joint fragility; solder joint structure; superior drop test performance; virtual fracture analysis; Arrays; Electronics packaging; Market research; Metals; Resistance; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474645
Filename :
6474645
Link To Document :
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